Open Access Research

Coping with disassembly yield uncertainty in remanufacturing using sensor embedded products

Mehmet Ali Ilgin*, Surendra M Gupta and Kenichi Nakashima

Journal of Remanufacturing 2011, 1:7  doi:10.1186/2210-4690-1-7

Accesses  

  • Last 30 days: 121 accesses
  • Last 365 days: 1258 accesses
  • All time: 4150 accesses